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E5071C
是德科技（原安捷倫）
0512-68050516
18914031336
1931048209
可銷售, 可租賃, 可維修, 可回收
E5071C 網絡分析儀具有同類產品中最高的射頻性能和最快的速度，并具有寬頻率范圍和全面的功能。它是制造和研發工程師們測試頻率范圍在 20 GHz 以內的射頻元器件和電路的理想解決方案。
廣泛的動態范圍：在測試端口處具有 > 123 dB 的動態范圍（典型值）
極快的測量速度：全雙端口校準時為 41 ms，1601 點
低跡線噪聲：70 kHz 中頻帶寬（IFBW）處為 0.004 dB rms
集成的 S 參數測試裝置
端口選項：2 端口和 4 端口
平衡測量能力（4 端口選件）
頻率選件：9 kHz 至 4.5 GHz/8.5 GHz、100 kHz 至 4.5 GHz/8.5 GHz （帶有偏置 T 型接頭）、300 kHz 至 20 GHz（帶有偏置 T 型接頭）
內置 Visual Basic 應用程序設計語言（VBA）
E5071C-008 Frequency offset mode
E5071C-010 Time domain analysis
E5071C-017 Removable Data Storage
E5071C-019 Standard Data Storage
E5071C-1A7 Calibration + Uncertainties + Guardbanding
E5071C-1CM Rack mount kit
E5071C-1CN Front handle kit
E5071C-1CP Rack mount and front handle kit
E5071C-1E5 High stability timebase
E5071C-240 2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-245 2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-260 2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
E5071C-265 2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-280 2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-285 2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-2D5 2-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-2K5 2-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-440 4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-445 4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-460 4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
E5071C-465 4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-480 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-485 4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-4D5 4-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-4K5 4-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-790 Measurement wizard assistant software
E5071C-810 Add keyboard
E5071C-820 Add mouse
E5071C-A6J ANSI Z540-1-1994 Calibration
E5071C-TDR Enhanced Time Domain Analysis
E5071C-UNQ Standard stability timebase
E5092A 可配置的多端口測試儀
E5071C 網絡分析儀具有同類產品中最高的射頻性能和最快的速度，并具有寬頻率范圍和全面的功能。它是制造和研發工程師們測試頻率范圍在 20 GHz 以內的射頻元器件和電路的理想解決方案。
廣泛的動態范圍：在測試端口處具有 > 123 dB 的動態范圍（典型值）
極快的測量速度：全雙端口校準時為 41 ms，1601 點
低跡線噪聲：70 kHz 中頻帶寬（IFBW）處為 0.004 dB rms
集成的 S 參數測試裝置
端口選項：2 端口和 4 端口
平衡測量能力（4 端口選件）
頻率選件：9 kHz 至 4.5 GHz/8.5 GHz、100 kHz 至 4.5 GHz/8.5 GHz （帶有偏置 T 型接頭）、300 kHz 至 20 GHz（帶有偏置 T 型接頭）
內置 Visual Basic 應用程序設計語言（VBA）
E5071C-008 Frequency offset mode
E5071C-010 Time domain analysis
E5071C-017 Removable Data Storage
E5071C-019 Standard Data Storage
E5071C-1A7 Calibration + Uncertainties + Guardbanding
E5071C-1CM Rack mount kit
E5071C-1CN Front handle kit
E5071C-1CP Rack mount and front handle kit
E5071C-1E5 High stability timebase
E5071C-240 2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-245 2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-260 2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
E5071C-265 2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-280 2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-285 2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-2D5 2-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-2K5 2-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-440 4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-445 4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-460 4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
E5071C-465 4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-480 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-485 4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-4D5 4-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-4K5 4-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-790 Measurement wizard assistant software
E5071C-810 Add keyboard
E5071C-820 Add mouse
E5071C-A6J ANSI Z540-1-1994 Calibration
E5071C-TDR Enhanced Time Domain Analysis
E5071C-UNQ Standard stability timebase
E5092A 可配置的多端口測試儀
